AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Machine learning (ML) is reshaping pipeline integrity management (PIM) from physics-based to data-driven paradigms. This ...

How might aerospace quality engineers progress from defect detection to making defects obsolete entirely? The key to doing so lies in the intersection of AI-based inspection technology, predictive ...